• DocumentCode
    1404546
  • Title

    Resolution of Diagnosis Based on Transition Faults

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    20
  • Issue
    1
  • fYear
    2012
  • Firstpage
    172
  • Lastpage
    176
  • Abstract
    The conventional detection conditions for transition faults do not predict fault effects that may be created when transition faults are activated and/or propagated by pulses (or hazards). For this, detection conditions that take hazards into consideration need to be used. However, since the occurrence of pulses cannot be predicted accurately based on a gate-level circuit description, the transition fault model becomes more susceptible to pattern-dependent effects, where errors on observed outputs that are predicted by the fault model may not appear in a circuit-under-diagnosis. This paper considers the implications of these pattern-dependent effects on the resolution of fault diagnosis based on transition faults.
  • Keywords
    fault location; hazards; circuit under diagnosis; conventional detection conditions; fault diagnosis; fault effects; gate level circuit; pattern dependent effects; transition faults; Circuit faults; Computational modeling; Delay; Fault diagnosis; Hazards; Very large scale integration; Defect diagnosis; diagnostic resolution; hazards; transition faults;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2010.2091975
  • Filename
    5668522