DocumentCode :
1404660
Title :
GaAs on Si: progress and promise
Author :
Shaw, Don W.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Volume :
35
Issue :
12
fYear :
1988
fDate :
12/1/1988 12:00:00 AM
Firstpage :
2428
Abstract :
Summary form only given, as follows. In spite of the large mismatch in lattice dimensions and thermal expansion properties, remarkable progress has been made in epitaxially depositing GaAs on Si substrates. The epitaxial layer quality, although clearly inferior to that of GaAs deposited on GaAs, is adequate for laboratory-scale fabrication of a variety of electronic and optoelectronic devices that exhibit reasonable performances. Two broad areas for applications of GaAs on Si are being considered. In one the Si serves to replace conventional GaAs substrate wafers with larger, stronger and less expensive Si substrates. The other, a longer range and more difficult application, involves fabrication of active devices both in the GaAs epitaxial layer and in the underlying Si substrate. An assessment of these applications with reference to the improvements in material quality that each requires is given
Keywords :
III-V semiconductors; elemental semiconductors; gallium arsenide; semiconductor epitaxial layers; semiconductor growth; semiconductor technology; silicon; substrates; GaAs epitaxial layer; GaAs on Si; GaAs-Si heteroepitaxy; Si substrate; applications; areas for applications; electronic devices; epitaxial layer quality; improvements in material quality; laboratory-scale fabrication; lattice mismatch; mismatch in lattice dimensions; optoelectronic devices; thermal expansion mismatch; Bandwidth; Gallium arsenide; Optical computing; Optical device fabrication; Optical interconnections; Optical modulation; Optical resonators; Optical sensors; Parallel processing; Substrates;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.8829
Filename :
8829
Link To Document :
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