• DocumentCode
    1404799
  • Title

    Imaging with solid immersion lenses, spatial resolution, and applications

  • Author

    Wu, Qiang ; Ghislain, Luke P. ; Elings, V.B.

  • Author_Institution
    IBM Microelctron., Hopewell Junction, NY, USA
  • Volume
    88
  • Issue
    9
  • fYear
    2000
  • Firstpage
    1491
  • Lastpage
    1498
  • Abstract
    Solid immersion microscopy, similar to liquid immersion microscopy, extends the diffraction limit by filling the object space with a high refractive index material, such as glass (index of refraction n=1.5-2), sapphire (n/spl sim/1.8), and semiconductor materials (n/spl sim/3), which shrink the wavelength of light. But solid immersion technique can achieve significantly higher spatial resolution since the refractive indices of available solids can be much higher than those of liquids (n=1.3-1.5). Besides high spatial resolution, solid immersion microscopy also possesses all the good properties of far-field imaging, such as high transmission efficiency and parallel imaging capability, which make it outstanding among beyond-the-diffraction-limit optical imaging techniques. In this paper, we discuss, from an experimental point of view, the resolution limit of solid immersion microscopy and the implementation of such technique in various applications.
  • Keywords
    image resolution; lenses; optical images; optical microscopy; diffraction limit; glass; near-field imaging; optical imaging; parallel imaging; refractive index; sapphire; semiconductor material; solid immersion lens; solid immersion microscopy; spatial resolution; transmission efficiency; Diffraction; Filling; High-resolution imaging; Lenses; Optical imaging; Optical microscopy; Optical refraction; Semiconductor materials; Solids; Spatial resolution;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.883320
  • Filename
    883320