DocumentCode
1404799
Title
Imaging with solid immersion lenses, spatial resolution, and applications
Author
Wu, Qiang ; Ghislain, Luke P. ; Elings, V.B.
Author_Institution
IBM Microelctron., Hopewell Junction, NY, USA
Volume
88
Issue
9
fYear
2000
Firstpage
1491
Lastpage
1498
Abstract
Solid immersion microscopy, similar to liquid immersion microscopy, extends the diffraction limit by filling the object space with a high refractive index material, such as glass (index of refraction n=1.5-2), sapphire (n/spl sim/1.8), and semiconductor materials (n/spl sim/3), which shrink the wavelength of light. But solid immersion technique can achieve significantly higher spatial resolution since the refractive indices of available solids can be much higher than those of liquids (n=1.3-1.5). Besides high spatial resolution, solid immersion microscopy also possesses all the good properties of far-field imaging, such as high transmission efficiency and parallel imaging capability, which make it outstanding among beyond-the-diffraction-limit optical imaging techniques. In this paper, we discuss, from an experimental point of view, the resolution limit of solid immersion microscopy and the implementation of such technique in various applications.
Keywords
image resolution; lenses; optical images; optical microscopy; diffraction limit; glass; near-field imaging; optical imaging; parallel imaging; refractive index; sapphire; semiconductor material; solid immersion lens; solid immersion microscopy; spatial resolution; transmission efficiency; Diffraction; Filling; High-resolution imaging; Lenses; Optical imaging; Optical microscopy; Optical refraction; Semiconductor materials; Solids; Spatial resolution;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/5.883320
Filename
883320
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