• DocumentCode
    1405144
  • Title

    Design consideration and performance of high-power and high-brightness InGaAs-InGaAsP-AlGaAs quantum-well diode lasers (/spl lambda/=0.98 /spl mu/m)

  • Author

    Yang, G.W. ; Hwu, R. Jennifer ; Xu, Z.T. ; Ma, X.Y.

  • Author_Institution
    Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA
  • Volume
    6
  • Issue
    4
  • fYear
    2000
  • Firstpage
    577
  • Lastpage
    584
  • Abstract
    We conduct a theoretical analysis of the design, fabrication, and performance measurement of high-power and high-brightness strained quantum-well lasers emitting at 0.98 /spl mu/m. The material system of interest consists of an Al-free InGaAs-InGaAsP active region and AlGaAs cladding layers. Some key parameters of the laser structure are theoretically analyzed, and their effects on the laser performance are discussed. The laser material is grown by metal-organic chemical vapor deposition and demonstrates high quality with low-threshold current density, high internal quantum efficiency, and extremely low internal loss. High-performance broad-area multimode and ridge-waveguide single-mode laser devices are fabricated. For 100-/spl mu/m-wide stripe lasers having a cavity length of 800 /spl mu/m, a high slope efficiency of 1.08 W-A, a low vertical beam divergence of 34/spl deg/, a high output power of over 4.45 W, and a very high characteristic temperature coefficient of 250 K were achieved. Lifetime tests performed at 1.2-1.3 W (12-13 mW//spl mu/m) demonstrates reliable performance. For 4-/spl mu/m-wide ridge waveguide single-mode laser devices, a maximum output power of 394 mW and fundamental mode power up to 200 mW with slope efficiency of 0.91 mW//spl mu/m are obtained.
  • Keywords
    III-V semiconductors; MOCVD; aluminium compounds; brightness; gallium arsenide; gallium compounds; indium compounds; laser cavity resonators; laser modes; optical design techniques; optical fabrication; optical testing; quantum well lasers; ridge waveguides; semiconductor device reliability; semiconductor device testing; waveguide lasers; 0.98 mum; 1.2 to 1.3 W; 100 mum; 250 K; 394 mW; 4 mum; 4.45 W; Al-free InGaAs-InGaAsP active region; AlGaAs; AlGaAs cladding layers; InGaAs-InGaAsP; InGaAs-InGaAsP-AlGaAs quantum-well diode lasers; broad-area multimode ridge-waveguide single-mode laser devices; extremely low internal loss; fundamental mode power; high internal quantum efficiency; high output power; high slope efficiency; high-brightness; high-brightness strained quantum-well lasers; high-power; laser performance; laser structure; lifetime tests; low-threshold current density; maximum output power; metal-organic chemical vapor deposition; optical design; optical fabrication; ridge waveguide single-mode laser devices; slope efficiency; Chemical lasers; Diode lasers; Laser theory; Optical design; Optical device fabrication; Optical materials; Performance analysis; Power generation; Power lasers; Quantum well lasers;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/2944.883371
  • Filename
    883371