Title :
BIST structure for DAC testing
Author :
Wen, Yun-Che ; Lee, Kuen-Jong
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
6/11/1998 12:00:00 AM
Abstract :
A built-in self-test (BIST) structure for digital-to-analogue converter (DAC) testing is presented. The basic idea is to divide the input codes (0, 1, ..., 2n-1) of the DAC under test into a number of segments. The DAC output voltages corresponding to different codes in the same segment are amplified to the same voltage value. Such that one single reference voltage can be used to test all codes in the same segment. By this method, the number of reference voltages required for DAC testing can be greatly reduced. We show that offset error, gain error, integral nonlinearity (INL) and differential nonlinearity (DNL) are effectively detected in the proposed BIST structure
Keywords :
automatic testing; built-in self test; digital-analogue conversion; integrated circuit testing; BIST structure; DAC output voltages; DAC testing; built-in self-test structure; differential nonlinearity; digital/analogue converter; gain error; integral nonlinearity; offset error; single reference voltage;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980874
