DocumentCode :
1405312
Title :
Concurrent Error Detection in Montgomery Multiplication over Binary Extension Fields
Author :
Hariri, Arash ; Reyhani-Masoleh, Arash
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, ON, Canada
Volume :
60
Issue :
9
fYear :
2011
Firstpage :
1341
Lastpage :
1353
Abstract :
Multiplication is one of the most important operations in finite field arithmetic. It is used in cryptographic and coding applications, such as elliptic curve cryptography and Reed-Solomon codes. In this paper, we consider the finite field multiplication used in elliptic curve cryptography and design concurrent error detection circuits. It is shown in the literature that the Montgomery multiplication can be used in cryptography to accelerate the scalar multiplication. Here, we use a parity-based concurrent error detection approach to increase the reliability of different Montgomery multipliers available in the literature. First, we consider bit-serial Montgomery multiplication and propose an error detection circuit. Then, we apply the same technique on the digit-serial Montgomery multiplication. Finally, we consider low time-complexity bit-parallel Montgomery multiplication and design the required components to implement the concurrent error detection circuits. ASIC implementations have been completed to analyze the time and area overheads of the proposed schemes. Also, the error detection capability is investigated by software simulations. We show that our approach results in efficient error detection schemes with small time and area overheads.
Keywords :
Reed-Solomon codes; computational complexity; error detection; public key cryptography; Reed-Solomon codes; area overheads; binary extension fields; bit-serial Montgomery multiplication; coding applications; design concurrent error detection circuits; digit-serial Montgomery multiplication; elliptic curve cryptography; finite field arithmetic; finite field multiplication; low time-complexity bit-parallel Montgomery multiplication; parity-based concurrent error detection approach; scalar multiplication; software simulations; time overheads; Algorithm design and analysis; Elliptic curve cryptography; Hardware; Logic gates; Polynomials; Redundancy; Montgomery multiplication; concurrent error detection; elliptic curve cryptography.; finite fields;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2010.258
Filename :
5669280
Link To Document :
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