DocumentCode
1405312
Title
Concurrent Error Detection in Montgomery Multiplication over Binary Extension Fields
Author
Hariri, Arash ; Reyhani-Masoleh, Arash
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, ON, Canada
Volume
60
Issue
9
fYear
2011
Firstpage
1341
Lastpage
1353
Abstract
Multiplication is one of the most important operations in finite field arithmetic. It is used in cryptographic and coding applications, such as elliptic curve cryptography and Reed-Solomon codes. In this paper, we consider the finite field multiplication used in elliptic curve cryptography and design concurrent error detection circuits. It is shown in the literature that the Montgomery multiplication can be used in cryptography to accelerate the scalar multiplication. Here, we use a parity-based concurrent error detection approach to increase the reliability of different Montgomery multipliers available in the literature. First, we consider bit-serial Montgomery multiplication and propose an error detection circuit. Then, we apply the same technique on the digit-serial Montgomery multiplication. Finally, we consider low time-complexity bit-parallel Montgomery multiplication and design the required components to implement the concurrent error detection circuits. ASIC implementations have been completed to analyze the time and area overheads of the proposed schemes. Also, the error detection capability is investigated by software simulations. We show that our approach results in efficient error detection schemes with small time and area overheads.
Keywords
Reed-Solomon codes; computational complexity; error detection; public key cryptography; Reed-Solomon codes; area overheads; binary extension fields; bit-serial Montgomery multiplication; coding applications; design concurrent error detection circuits; digit-serial Montgomery multiplication; elliptic curve cryptography; finite field arithmetic; finite field multiplication; low time-complexity bit-parallel Montgomery multiplication; parity-based concurrent error detection approach; scalar multiplication; software simulations; time overheads; Algorithm design and analysis; Elliptic curve cryptography; Hardware; Logic gates; Polynomials; Redundancy; Montgomery multiplication; concurrent error detection; elliptic curve cryptography.; finite fields;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.2010.258
Filename
5669280
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