DocumentCode
1405404
Title
Test Technology TC Newsletter
Volume
27
Issue
1
fYear
2010
Firstpage
90
Lastpage
91
Abstract
This month´s Test Technology TC Newsletter features upcoming events: 13th Design, Automation, and Test in Europe Conference, the 11th Latin-American Test Workshop, the 28th IEEE VLSI Test Symposium, and a Call for Papers for ITC 2010.
Keywords
DATE 2010; ITC 2010; LATW 2010; VTS 2010;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.26
Filename
5406677
Link To Document