DocumentCode :
1405404
Title :
Test Technology TC Newsletter
Volume :
27
Issue :
1
fYear :
2010
Firstpage :
90
Lastpage :
91
Abstract :
This month´s Test Technology TC Newsletter features upcoming events: 13th Design, Automation, and Test in Europe Conference, the 11th Latin-American Test Workshop, the 28th IEEE VLSI Test Symposium, and a Call for Papers for ITC 2010.
Keywords :
DATE 2010; ITC 2010; LATW 2010; VTS 2010;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2010.26
Filename :
5406677
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1405404
