DocumentCode
1405442
Title
Characterisation of layered dielectric medium using reflection coefficient
Author
Huang, Y. ; Nakhkash, M.
Author_Institution
Liverpool Univ., UK
Volume
34
Issue
12
fYear
1998
fDate
6/11/1998 12:00:00 AM
Firstpage
1207
Lastpage
1208
Abstract
The question of whether both the complex permittivity and the thickness of a single-layer medium can be obtained using the reflection coefficient is discussed. It is demonstrated that all of these parameters can be obtained by the use of reflection coefficients at two slightly different frequencies. A useful equation for this application is also derived
Keywords
electromagnetic wave reflection; complex permittivity; free-space method; layer thickness; layered dielectric medium; reflection coefficient;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980862
Filename
702375
Link To Document