Title :
One-port S-parameter measurements using quasi-optical multistate reflectometer
Author :
Thompson, D. ; Pollard, R.D. ; Miles, R.E.
Author_Institution :
Sch. of Electron. & Electr. Eng., Leeds Univ., UK
fDate :
6/11/1998 12:00:00 AM
Abstract :
A novel multistate reflectometer built using entirely quasi-optical components and capable of operation in the terahertz frequency region has been designed and tested. The system has been calibrated at 100 GHz and measurements of the complex reflection coefficient of passive devices have been made. Excellent agreement, well within the experimental uncertainty, is achieved between the results from a vector network analyser and the quasi-optical multistate
Keywords :
S-parameters; microwave reflectometry; millimetre wave measurement; reflectometers; submillimetre wave measurement; waveguide components; 75 GHz to 1.6 THz; THF operation; complex reflection coefficient; one-port S-parameter measurements; passive waveguide devices; quasi-optical multistate reflectometer; terahertz frequency region;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980879
