Title :
Simple parameter extraction method for non-ideal Schottky barrier diodes
Author :
Lee, J.I. ; Brini, J. ; Dimitriadis, C.A.
Author_Institution :
Lab. de Phys. des Composants a Semicond., ENSERG, Grenoble, France
fDate :
6/11/1998 12:00:00 AM
Abstract :
Simple, on-site parameter extraction methods are proposed; the ideality factor, series resistance, leakage resistance and saturation current are determined from the current-voltage characteristics of a Schottky barrier diode
Keywords :
Schottky diodes; electric resistance; leakage currents; semiconductor device testing; current-voltage characteristics; ideality factor; leakage resistance; nonideal Schottky barrier diodes; parameter extraction method; saturation current; series resistance;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980831
