• DocumentCode
    1405808
  • Title

    Two novel methods for estimating the compound K-clutter parameters in presence of thermal noise

  • Author

    Mezache, Amar ; Sahed, M. ; Laroussi, Toufik ; Chikouche, Djamel

  • Author_Institution
    Dept. dElectronique, Univ. de Constantine, Constantine, Algeria
  • Volume
    5
  • Issue
    9
  • fYear
    2011
  • Firstpage
    934
  • Lastpage
    942
  • Abstract
    In this study, the authors present two novel methods to estimate the parameters of the compound K-clutter in presence of additive thermal noise. Based on the parametric fitting to the tail of the clutter distribution, the first method estimates simultaneously the unknown parameters. This is achieved by comparing the experimental cumulative distribution function, drawn from the recorded data intensity, to a set of curves derived from the mathematical model. To this effect, a multidimensional unconstraint non-linear algorithm; namely the Nelder-Mead method is used to minimise the residuals between the real data and the fitted curve with unknown parameters. Considering always the presence of thermal noise and based on the neuronal approaches and fuzzy inference systems, the second method also yields an accurate estimation and guarantees an inexpensive computation of the unknown parameters when the clutter-to-noise ratio (CNR), is known a priori. To assess the obtained results, the authors illustrate the effectiveness of these new methods through Monte-Carlo simulations.
  • Keywords
    Monte Carlo methods; curve fitting; fuzzy reasoning; parameter estimation; thermal noise; ISSN compound K-clutter parameter estimation; Monte-Carlo simulation; Nelder-Mead method; additive thermal noise; clutter distribution; clutter-to-noise ratio; curve fitting; data intensity; experimental cumulative distribution function; fuzzy inference system; mathematical model; multidimensional unconstraint nonlinear algorithm; neuronal approach;
  • fLanguage
    English
  • Journal_Title
    Radar, Sonar & Navigation, IET
  • Publisher
    iet
  • ISSN
    1751-8784
  • Type

    jour

  • DOI
    10.1049/iet-rsn.2010.0296
  • Filename
    6111407