Title :
Stratified random sampling for power estimation
Author :
Ding, Chih-Shun ; Wu, Qing ; Hsieh, Cheng-Ta ; Pedram, Massoud
Author_Institution :
Rockwell Semicond. Syst., Newport Beach, CA, USA
fDate :
6/1/1998 12:00:00 AM
Abstract :
In this paper, we present new statistical sampling techniques for performing power estimation at the circuit level. These techniques first transform the power estimation problem to a survey sampling problem, and then apply stratified random sampling to improve the efficiency of sampling. The stratification is based on a low-cost predictor, such as the zero-delay power estimate. We also propose a two-stage stratified sampling technique to handle very long initial sequences. Experimental results show that the efficiency of stratified random sampling and two-stage stratified sampling techniques are 3-10 times higher than that of simple random sampling and the Markov-based Monte Carlo simulation techniques
Keywords :
integrated circuit modelling; parameter estimation; statistical analysis; VLSI; circuit level; power estimation; predictor; statistical sampling; stratified random sampling; survey sampling; Circuit simulation; Combinational circuits; Energy consumption; Frequency; Gaussian distribution; Markov processes; Monitoring; Probability distribution; Sampling methods; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on