DocumentCode :
1405867
Title :
Signature analysis for analog and mixed-signal circuit test response compaction
Author :
Nagi, Naveena ; Chatterjee, Abhijit ; Yoon, Heebyung ; Abraham, Jacob A.
Author_Institution :
Texas Univ., Austin, TX, USA
Volume :
17
Issue :
6
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
540
Lastpage :
546
Abstract :
While the design of signature analyzers for digital circuits has been well researched in the past, signature analyzers for analog signals are relatively unknown. The primary difficulty in analyzing signatures for analog signals is that the latter are imprecise in nature. Therefore, deterministic signature analysis schemes, such as those based on finite-field arithmetic using linear feedback shift registers, are unsuitable for analog circuits. In this paper, a novel signature analysis scheme for analog and mixed signal circuits is proposed. The signatures possess the interesting property that if the input analog signal is imprecise within certain bounds (an inherent property of analog signals), then the generated signature is also imprecise within certain bounds. A failure is indicated by the generated signature being different from the expected signature by a margin greater than a predetermined threshold; the larger the effects of the failure, the larger the difference between the generated signature and the expected signature. The probabilities of aliasing and false rejection are also derived. Results for an example filter circuit are presented
Keywords :
analogue integrated circuits; integrated circuit testing; mixed analogue-digital integrated circuits; aliasing probability; analog circuit; false rejection probability; filter; integrator; mixed-signal circuit; signature analysis; test response compaction; Analog circuits; Arithmetic; Circuit analysis; Circuit testing; Digital circuits; Filters; Linear feedback shift registers; Signal analysis; Signal design; Signal generators;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.703834
Filename :
703834
Link To Document :
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