• DocumentCode
    1406226
  • Title

    Noise analysis in air-coupled PVDF ultrasonic sensors

  • Author

    Fiorillo, Antonino S.

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Sannio, Benevento, Italy
  • Volume
    47
  • Issue
    6
  • fYear
    2000
  • Firstpage
    1432
  • Lastpage
    1437
  • Abstract
    In this paper we analyze the noise generated in a piezo-polymer based sensor for low frequency ultrasound in air. The sensor includes two curved PVDF transducers for medium and short range applications. A lumped RLC equivalent circuit was derived from the measurement of the transducer´s electrical admittance, in air, by taking into account both mechanical and dielectric losses, which we suppose are the major sources of noise in similar devices. The electrical model was used to study and optimize the noise performance of a 61 kHz transducer and to simulate the electrical behavior of the complete transmitter-receiver system. The validity of the overall electrical model with low noise was confirmed after verifying, with Pspice, agreement of the practical and theoretical results.
  • Keywords
    acoustic noise; dielectric losses; electric admittance; equivalent circuits; losses; lumped parameter networks; piezoelectric thin films; piezoelectric transducers; polymer films; ultrasonic transducers; Pspice; air-coupled PVDF ultrasonic sensors; curved PVDF transducers; dielectric losses; electrical admittance; electrical model; low frequency ultrasound; lumped RLC equivalent circuit; mechanical losses; medium range applications; noise analysis; noise performance; piezo-polymer based sensor; short range applications; transducer; transmitter-receiver system; Admittance measurement; Circuit noise; Dielectric loss measurement; Equivalent circuits; Frequency; Low-frequency noise; Mechanical sensors; Noise generators; Ultrasonic imaging; Ultrasonic transducers;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.883532
  • Filename
    883532