Title :
Low-cost large area processing using small area substrates-a novel multitiled palletization concept for MCM-D thin film process
Author :
Bhattacharya, S.K. ; Gardner, B.M. ; Qu, J. ; Baldwin, D.F. ; Tummala, R.R.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Multichip module-deposited (MCM-D) has been the solution for integrated high density packaging due to its superior line resolution and higher inputs/outputs (I/O) density compared to MCM-C and multichip module-laminate (MCM-L) technologies. However the consumer demand for high performance products at reduced costs is ever increasing, and this trend is expected to continue in the 21st Century. In order to find a low-cost solution for future MCM-D packaging, a novel palletization process which incorporates several tiles (alumina or silicon) on a large carrier glass (pallet) has been established in this study. The multitiling format provides simultaneous processing of several small tiles onto a re-usable CTE matched carrier glass. The tiles are attached to the glass with a low modulus adhesive that can be released at an elevated temperature (/spl sim/450/spl deg/C). The objective of this study is to develop a multitiling process for a 300 mm/spl times/300 mm area that is scalable up to 600 mm/spl times/600 mm format. There are several challenges in realization of the large area palletization approach, such as formulation and qualification of a high temperature reworkable adhesive and minimization of out-of-plane warpage of the tiled assembly. Finite element models for warpage and its validation by shadow moire measurement, formulation of a compliant adhesive for thermal stability up to 400/spl deg/C are reported in previous publications. This paper deals with (1) the validation of the palletization concept on a 300 mm x 300 mm glass with weight restriction below 3 lbs and thickness limitation to <6.25 mm, and (2) qualification of the formulated adhesive through a correlative study on high temperature detachability of the attached tiles, chemical compatibility of the adhesive with acids, bases, and less polar solvents, and interfacial shear strength at the lass/adhesive/tile joints. MCM-D thin film process on the tiled substrates is to be conducted by the member compan- es of the MCM-D Consortium.
Keywords :
adhesives; finite element analysis; multichip modules; shear strength; substrates; thermal management (packaging); thermal stability; MCM-D thin film process; borofloat; chemical compatibility; clearfloat; compliant adhesive; finite element models; high temperature detachability; integrated high density packaging; interfacial shear strength; large carrier glass pallet; low modulus adhesive; low-cost large area processing; multitiled palletization concept; out-of-plane warpage minimization; reusable CTE matched carrier glass; shadow moire measurement; simultaneous processing; small area substrates; thermal stability; Assembly; Costs; Finite element methods; Glass; Packaging; Qualifications; Silicon; Temperature; Transistors;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/6040.883756