• DocumentCode
    1406831
  • Title

    Tip and sample flexibility effects on tapping mode (amplitude modulation) AFM measurements

  • Author

    Pishkenari, Hossein Nejat ; Meghdari, Ali

  • Author_Institution
    Nano-Robot. Lab., Sharif Univ. of Technol., Tehran, Iran
  • Volume
    6
  • Issue
    12
  • fYear
    2011
  • fDate
    12/1/2011 12:00:00 AM
  • Firstpage
    1023
  • Lastpage
    1028
  • Abstract
    This Letter is devoted to the investigation of the tip, substrate and particle flexibility effects on the elastic deformation, the maximum repulsive force and the topography images in tapping mode (amplitude modulation) atomic force microscopy (TM-AFM). Several quantitative comparisons among the different models are presented and the effects of the elastic deformations on TM-AFM measurement are investigated.
  • Keywords
    amplitude modulation; atomic force microscopy; elastic deformation; surface topography; atomic force microscopy; elastic deformation; repulsive force; sample flexibility effect; tapping mode AFM measurement; topography;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2011.0540
  • Filename
    6111576
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1406831