DocumentCode
1406879
Title
Constant energy device test for electrostatic discharge (ESD) of semiconductor devices
Author
Greason, William D. ; Bulach, Sviatoslav
Author_Institution
Dept. of Electr. Eng., Univ. of Western Ontario, London, Ont., Canada
Volume
33
Issue
1
fYear
1997
Firstpage
286
Lastpage
297
Abstract
An analysis is presented fur the models and test methods used to simulate the electrostatic discharge (ESD) event for a charged semiconductor device. A new constant energy device (CED) test method is proposed to provide control of charge and potential for constant energy discharges and give a better evaluation of device reliability. Experimental results are presented for tests conducted on a basic CMOS structure
Keywords
MIS devices; electrostatic discharge; semiconductor device models; semiconductor device reliability; semiconductor device testing; CMOS semiconductor devices; ESD event; constant energy device test; constant energy discharges; device reliability; electrostatic discharge; Circuit testing; Electrostatic discharge; Equations; Integrated circuit modeling; Integrated circuit packaging; Pins; Semiconductor device testing; Semiconductor devices; Switches; Switching circuits;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/28.567133
Filename
567133
Link To Document