• DocumentCode
    1406928
  • Title

    Surface micromachining for microelectromechanical systems

  • Author

    Bustillo, James M. ; Howe, Roger T. ; Muller, Richard S.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    86
  • Issue
    8
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    1552
  • Lastpage
    1574
  • Abstract
    Surface micromachining is characterized by the fabrication of micromechanical structures from deposited thin films. Originally employed for integrated circuits, films composed of materials such as low-pressure chemical-vapor-deposition polycrystalline silicon, silicon nitride, and silicon dioxides can be sequentially deposited and selectively removed to build or “machine” three-dimensional structures whose functionality typically requires that they be freed from the planar substrate. Although the process to accomplish this fabrication dates from the 1960´s, its rapid extension over the past few years and its application to batch fabrication of micromechanisms and of monolithic microelectromechanical systems (MEMS) make a thorough review of surface micromachining appropriate at this time. Four central issues of consequence to the MEMS technologist are: (i) the understanding and control of the material properties of microstructural films, such as polycrystalline silicon, (ii) the release of the microstructure, for example, by wet etching silicon dioxide sacrificial films, followed by its drying and surface passivation, (iii) the constraints defined by the combination of micromachining and integrated-circuit technologies when fabricating monolithic sensor devices, and (iv) the methods, materials, and practices used when packaging the completed device. Last, recent developments of hinged structures for postrelease assembly, high-aspect-ratio fabrication of molded parts from deposited thin films, and the advent of deep anisotropic silicon etching hold promise to extend markedly the capabilities of surface-micromachining technologies
  • Keywords
    CVD coatings; micromachining; micromechanical devices; Si; Si3N4; SiO2; deep anisotropic etching; drying; high-aspect-ratio fabrication; hinged structure; integrated MEMS technology; low-pressure chemical vapor deposition; microelectromechanical system; microstructure; molded part; monolithic sensor; packaging; planar substrate; polycrystalline silicon; sacrificial release layer; silicon dioxide; silicon nitride; surface micromachining; surface passivation; thin film; three-dimensional structure; wet etching; Centralized control; Chemicals; Fabrication; Microelectromechanical systems; Micromachining; Micromechanical devices; Semiconductor films; Silicon compounds; Sputtering; Thin film circuits;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.704260
  • Filename
    704260