Circuit analysis of an ultrafast junction mixing scanning tunneling microscope

Author

Steeves, G.M. ; Elezzabi, A.Y. ; Teshima, R. ; Said, R.A. ; Freeman, M.R.

Author_Institution

Dept. of Phys., Alberta Univ., Edmonton, Alta., Canada

Volume

34

Issue

8

fYear

1998

fDate

8/1/1998 12:00:00 AM

Firstpage

1415

Lastpage

1418

Abstract

A lumped element circuit model for the operation of a junction mixing scanning tunneling microscope (JM-STM) is presented. Fits from this model show excellent agreement with experimental results in the picosecond time regime. The tip sample capacitance employed in the model was calculated to be 33 fF, using the method of images. By varying the capacitance, various tip/sample geometries can be investigated. Testing the response of the model tunnel junction, for faster electrical pulses, suggests how the JM-STM can be pushed into the femtosecond time regime

Keywords

capacitance; equivalent circuits; high-speed optical techniques; lumped parameter networks; measurement by laser beam; nanostructured materials; photoconducting switches; scanning tunnelling microscopy; 33 fF; JM-STM; circuit analysis; faster electrical pulses; femtosecond time regime; junction mixing scanning tunneling microscope; lumped element circuit model; model tunnel junction; picosecond time regime; scanning tunneling microscope; tip sample capacitance; tip/sample geometries; ultrafast junction; Capacitance; Circuit analysis; Optical microscopy; Optical pulses; Physics; Scanning electron microscopy; Spatial resolution; Tunneling; Ultrafast electronics; Ultrafast optics;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.704332

Filename

704332