• DocumentCode
    1407388
  • Title

    Simulation and design of InAlAs/InGaAs pnp heterojunction bipolar transistors

  • Author

    Datta, Suman ; Shi, Shen ; Roenker, Kenneth P. ; Cahay, Marc M. ; Stanchina, William E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
  • Volume
    45
  • Issue
    8
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    1634
  • Lastpage
    1643
  • Abstract
    The performance capabilities of InP-based pnp heterojunction bipolar transistors (HBT´s) have been investigated using a drift-diffusion transport model based on a commercial numerical simulator. The low hole mobility in the base is found to limit the current gain and the base transit time, which limits the device´s cutoff frequency. The high electron majority carrier mobility in the n+ InGaAs base allows a reduction in the base doping and width while maintaining an adequately low base resistance. As a result, high current gain (>300) and power gain (>40 dB) are found to be possible at microwave frequencies. A cutoff frequency as high as 23 GHz and a maximum frequency of oscillation as high as 34 GHz are found to be possible without base grading. Comparison is made with the available, reported experimental results and good agreement is found. The analysis indicates that high-performance pnp InP-based HBT´s are feasible, but that optimization of the transistor´s multilayer structure is different than for the npn device
  • Keywords
    III-V semiconductors; aluminium compounds; electron mobility; gallium arsenide; heterojunction bipolar transistors; hole mobility; indium compounds; microwave bipolar transistors; semiconductor device models; 23 to 34 GHz; 40 dB; InAlAs-InGaAs; InAlAs/InGaAs pnp heterojunction bipolar transistor; InP; base doping; base resistance; base transit time; current gain; cutoff frequency; design; drift-diffusion transport model; electron majority carrier mobility; hole mobility; maximum frequency of oscillation; microwave HBT; multilayer structure; numerical simulation; power gain; Cutoff frequency; Doping; Electron mobility; Gain; Heterojunction bipolar transistors; Indium compounds; Indium gallium arsenide; Microwave frequencies; Nonhomogeneous media; Numerical simulation;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.704357
  • Filename
    704357