Title :
A High-Efficiency CMOS DC-DC Converter With 9-
s Transient Recovery Time
Author :
Liu, Pang-Jung ; Ye, Wei-Shan ; Tai, Jia-Nan ; Chen, Hsin-Shu ; Chen, Jau-Horng ; Chen, Yi-Jan Emery
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
3/1/2012 12:00:00 AM
Abstract :
This paper presents an efficient CMOS dc-dc converter with fast transient recovery. A fast-transient control operating in conjunction with a linearly scaled gate-driving technique is used to concurrently improve the transient response and light-load efficiency of a dc-dc converter. The controller operates under a pulse-width modulation mode during steady state and enables a saturation mode during transient to attain fast transient response. The linearly scaled gate-driving technique optimizes the gate-driving voltage with respect to the changing load leading to lower gate-driving loss and better light-load efficiency. A prototype chip was implemented using a commercial 0.35-μm CMOS process to validate the proposed techniques. The measurement result shows a 5% increase in light-load efficiency and achieves an overall maximum efficiency of 90%. Moreover, the transient recovery time of a 450 mA step load change is less than 9 μs.
Keywords :
CMOS integrated circuits; DC-DC power convertors; PWM power convertors; PWM mode; current 450 mA; efficiency 90 percent; fast transient recovery; gate-driving voltage; high-efficiency CMOS dc-dc converter; light-load efficiency; linearly scaled gate-driving technique; pulsewidth modulation mode; saturation mode; size 0.35 mum; time 9 mus; transient response; Logic gates; Power transistors; Pulse width modulation; Switching frequency; Transient analysis; Transient response; Voltage control; CMOS; dc-dc converter; efficiency; transient response;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2011.2167259