DocumentCode :
1407682
Title :
InAlAs/InGaAs channel composition modulated transistors with InAs channel and AlAs/InAs superlattice barrier layer
Author :
Onda, K. ; Fujihara, A. ; Wakejima, A. ; Mizuki, E. ; Nakayama, T. ; Miyamoto, H. ; Ando, Y. ; Kanamori, M.
Author_Institution :
Kansai Electron. Res. Labs., NEC Corp., Shiga, Japan
Volume :
19
Issue :
8
fYear :
1998
Firstpage :
300
Lastpage :
302
Abstract :
We have successfully fabricated a new type of InAlAs/InGaAs heterojunction FET (HJFET) with modulated indium composition channels, called channel composition modulated transistors (CCMTs) in which an InAs channel is sandwiched by In/sub 0.53/Ga/sub 0.47/As/In/sub 0.8/Ga/sub 0.2/As sub-channels. The fabricated devices also employ an AlAs/InAs superlattice as a barrier layer against impurity contamination to provide high thermal stability. A 0.2-μm T-shaped gate device exhibits a g/sub m/ of 1370 mS/mm, FT of 180 GHz and Fmax of 210 GHz at a low drain bias of 1.0 V. In high-temperature DC life tests conducted at more than 230/spl deg/C, the devices exhibited less than a 3% degradation in I/sub dss/ and g/sub m/ after 1000 h. This demonstrates that these newly-developed CCMTs incorporating AlAs/InAs superlattice insertion technology can offer high-performance and highly-reliable InP-based HJFET´s for various microwave and millimeter-wave applications.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; junction gate field effect transistors; semiconductor superlattices; 0.2 micron; 1.0 V; 180 to 210 GHz; 230 C; AlAs-InAs; AlAs/InAs superlattice barrier; InAlAs-InGaAs; InAlAs/InGaAs channel composition modulated transistor; InAs channel; T-shaped gate device; heterojunction FET; high-temperature DC life test; impurity contamination; insertion technology; thermal stability; Contamination; Degradation; FETs; Heterojunctions; Impurities; Indium compounds; Indium gallium arsenide; Life testing; Superlattices; Thermal stability;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.704406
Filename :
704406
Link To Document :
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