• DocumentCode
    1407954
  • Title

    Pattern Classification With Class Probability Output Network

  • Author

    Woon Jeung Park ; Rhee Man Kil

  • Author_Institution
    Dept. of Math. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • Volume
    20
  • Issue
    10
  • fYear
    2009
  • Firstpage
    1659
  • Lastpage
    1673
  • Abstract
    The output of a classifier is usually determined by the value of a discriminant function and a decision is made based on this output which does not necessarily represent the posterior probability for the soft decision of classification. In this context, it is desirable that the output of a classifier be calibrated in such a way to give the meaning of the posterior probability of class membership. This paper presents a new method of postprocessing for the probabilistic scaling of classifier´s output. For this purpose, the output of a classifier is analyzed and the distribution of the output is described by the beta distribution parameters. For more accurate approximation of class output distribution, the beta distribution parameters as well as the kernel parameters describing the discriminant function are adjusted in such a way to improve the uniformity of beta cumulative distribution function (CDF) values for the given class output samples. As a result, the classifier with the proposed scaling method referred to as the class probability output network (CPON) can provide accurate posterior probabilities for the soft decision of classification. To show the effectiveness of the proposed method, the simulation for pattern classification using the support vector machine (SVM) classifiers is performed for the University of California at Irvine (UCI) data sets. The simulation results using the SVM classifiers with the proposed CPON demonstrated a statistically meaningful performance improvement over the SVM and SVM-related classifiers, and also other probabilistic scaling methods.
  • Keywords
    decision making; pattern classification; probability; sampling methods; statistical distributions; CDF; CPON; beta cumulative distribution function; beta distribution parameter; class probability output network; decision making; discriminant function; output sample; pattern classification; posterior probability; Density functional theory; Distribution functions; Kernel; Pattern classification; Probability density function; Probability distribution; Risk management; Support vector machine classification; Support vector machines; Training data; Bayes decision; beta distribution; classification; probabilistic scaling; support vector machine (SVM); Algorithms; Computer Simulation; Feedback; Models, Statistical; Neural Networks (Computer); Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Neural Networks, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1045-9227
  • Type

    jour

  • DOI
    10.1109/TNN.2009.2029103
  • Filename
    5247015