• DocumentCode
    1408483
  • Title

    Silicon avalanche cathodes and their characteristics

  • Author

    Ea, Jung Y. ; Zhu, Dazhong ; Lu, Yicheng ; Lalevic, B. ; Zeto, Robert J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
  • Volume
    38
  • Issue
    10
  • fYear
    1991
  • fDate
    10/1/1991 12:00:00 AM
  • Firstpage
    2377
  • Lastpage
    2382
  • Abstract
    A highly doped shallow p-n junction (⩽300 Å) is used to fabricate a silicon avalanche cathode (SAC) to serve as an electron source for a micro-vacuum diode. Single and arrayed SACs are integrated on the same chip with separate bias configurations. Since the device fabrication is fully compatible with Si IC processing, high repeatability and reliability are achieved. The device structure and a simple series resistance model are described. An anode collection current of ~0.7 μA is obtained from a single cathode (40-μm diameter), and the emission current is multiplied by the number of cathodes for arrayed cathodes. Emission characteristics are investigated as a function of reverse-bias conditions, anode collection voltages, and cathode diameters. The emission efficiency (anode collection current/total bias current) is found to be almost independent of cathode size; however, higher anode collection voltages increase the emission efficiency
  • Keywords
    avalanche diodes; cathodes; electron field emission; p-n homojunctions; silicon; vacuum microelectronics; 0.7 muA; 40 micron; Si avalanche cathodes; anode collection current; anode collection voltages; arrayed cathodes; bias configurations; cathode diameters; characteristics; device fabrication; device structure; electron source; emission current; emission efficiency; high repeatability; highly doped shallow p-n junction; micro-vacuum diode; reliability; reverse-bias conditions; series resistance model; Anodes; Cathodes; Current density; Electron emission; Electron sources; P-n junctions; Semiconductor diodes; Silicon; Valves; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.88529
  • Filename
    88529