Title :
Effects of the Size of the Doped SiC Nanoparticles on the Critical Current Density of the Ti-Sheathed MgB
Superconducting Wires
Author :
Liang, G. ; Fang, H. ; Luo, Z.P. ; Keith, S. ; Hoyt, C.
Author_Institution :
Dept. of Phys., Sam Houston State Univ., Huntsville, TX, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
The effects of the grain size of the doped SiC nanoparticles on the critical current density (Jc) of the Ti-sheathed MgB2 superconducting wires were studied. The concentration of the SiC dopant was 10% and the sizes of the SiC particles were 20 nm, 45 nm, and 123 nm. Contrary to the Jc results reported on the SiC-doped Fe-sheathed MgB2 wires, we found that the Jc for the Ti-sheathed MgB2 wires decreased with the size of the SiC particles. We also found that the Jc is greater than that of the undoped MgB2 wires only for the wires with 123 nm SiC size. This unusual dependence of Jc on the size of the SiC dopant is discussed in association with the results from the magnetization, electrical resistivity, x-ray diffraction, and transmission electron microscopy measurements.
Keywords :
X-ray diffraction; critical current density (superconductivity); electrical resistivity; grain size; magnesium compounds; magnetisation; nanoparticles; particle size; silicon compounds; superconducting tapes; transmission electron microscopy; type II superconductors; MgB2:SiC; critical current density; electrical resistivity; grain size; magnetization; nanoparticles; particle size; superconducting wires; transmission electron microscopy; x-ray diffraction; Doping; Grain size; Powders; Scanning electron microscopy; Silicon carbide; Wires; X-ray scattering; Critical current density; SiC nanoparticles; magnesium diboride; magnetization;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2091616