• DocumentCode
    1408751
  • Title

    Effect of Charge Injection Due to ESD on the Operation of MEMS

  • Author

    Greason, William D.

  • Author_Institution
    Appl. Electrostatics Res. Centre, Univ. of Western Ontario, London, ON, Canada
  • Volume
    45
  • Issue
    5
  • fYear
    2009
  • Firstpage
    1559
  • Lastpage
    1567
  • Abstract
    The relative effect of charge injection due to human-body model electrostatic discharge (ESD) on the operation of capacitive microelectromechanical systems (MEMS) structures is studied. The influence on the operating characteristics as a function of feature size is analyzed; for small gaps (< 5 mum), the modified Paschen´s law applies. A force factor is introduced to compare forces due to the control voltage and trapped charge due to ESD or triboelectrification and assess possible failure due to stiction. The results show that the relative effect of injected charge due to ESD increases inversely as the square of the gap separation for floating targets and inversely as the square of the plate area for grounded targets. For comparison purposes, the relative effect of charge injection due to triboelectrification is shown to be independent of device scaling. An electric-field model for the air gap and dielectric layer is introduced to assess the reliability of MEMS due to trapped charge in the dielectric.
  • Keywords
    charge injection; electrostatic discharge; micromechanical devices; ESD; MEMS; capacitive microelectromechanical systems; charge injection; electric-field model; gap separation; human-body model electrostatic discharge; modified Paschen law; triboelectrification; Biological system modeling; CMOS technology; Dielectrics; Electrostatic discharge; Force control; Industry Applications Society; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Voltage control; Charge injection; electrostatic discharge (ESD); microelectromechanical systems (MEMS); model;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2009.2027110
  • Filename
    5247134