• DocumentCode
    1408877
  • Title

    Characterization of embedded passives using macromodels in LTCC technology

  • Author

    Choi, Kwang Lim ; Na, Nanju ; Swaminathan, Madhavan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    21
  • Issue
    3
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    258
  • Lastpage
    268
  • Abstract
    This paper discusses the frequency and time domain response of embedded passive components in a multilayered structure fabricated using low temperature co-fired ceramic (LTCC) technology. A rational polynomial approximation that combines the accuracy of EM solvers with interpolation methods has been used to capture the frequency dependent losses and parasitics of embedded passives in a macro-model. This method allows for a significant speed-up in computation time while using commercial EM solvers. The macromodel with suitable modification has been used to compute the time domain response in SPICE for typical embedded passive structures. Simulation results show good correlation with time domain reflectometry/time-domain-transmission (TDR/TDT) measurements. The behavior of embedded passives in the high frequency operation of transmission lines and voltage divider networks has also been discussed
  • Keywords
    SPICE; ceramics; interpolation; packaging; polynomials; EM solver; LTCC technology; SPICE simulation; embedded passive component; frequency domain response; interpolation; losses; low temperature co-fired ceramic; macromodel; multilayered packaging; parasitics; rational polynomial approximation; time domain response; transmission line; voltage divider network; Ceramics; Computational modeling; Embedded computing; Frequency dependence; Interpolation; Polynomials; Reflectometry; SPICE; Temperature; Transmission line measurements;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.704936
  • Filename
    704936