Title :
Two Algorithms for Multiple-View Binary Pattern Reconstruction
Author :
Chang, S. ; Shelton, G. L.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, N. Y. 10598
Abstract :
The problem of reconstructing binary patterns from their shadows or projections is treated. Two algorithms are formulated. For the two-view case, both algorithms give a perfect reconstruction if and only if the pattern is two-view unambiguous. It is also shown that n views are sufficient, but not necessary, to reconstruct any n à n binary pattern. Experimental results for the four-view reconstruction of 25 à 25 binary patterns indicate that one of the algorithms has good convergency behavior.
Keywords :
Equations; Pattern recognition;
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
DOI :
10.1109/TSMC.1971.5408614