Title :
Computer-Based Thermographic Displays and Real-Time Techniques
Author :
Ballard, Douglas W. ; Stiefeld, Bernard
Author_Institution :
Nondestructive Test Division, Sandia Laboratories, Albuquerque, N. Mex. 87115.
Abstract :
Nondestructive test methods have traditionally been involved in the detection of localized or point defects such as cracks, voids, and inclusions. However, there has been an increasing demand for meaningful NDT methods that characterize material properties over large surface areas or within the entire volume of a component or structure. Infrared techniques, which lend themselves to area and volume coverage, have been refined for this purpose to a high degree. Simultaneously, there has been a major effort to increase the effectiveness and utility of the large amounts of data resulting from IR scans. This paper concentrates on data enhancement methods, using both real-time and computer-treatment techniques. The data reduction methods covered are significant departures from present NDT data presentations and are aimed primarily at the major ``IR customers´´-the materials and design engineers.
Keywords :
Circuits; Computer displays; Conducting materials; Design engineering; Microelectronics; Nondestructive testing; Optical materials; Real time systems; Temperature; Thermal conductivity;
Journal_Title :
Industrial Electronics and Control Instrumentation, IEEE Transactions on
DOI :
10.1109/TIECI.1973.5408633