Title :
Transit time reduction in AlGaAs/GaAs HBTs with p-type collector
Author :
Morizuka, K. ; Katoh, R. ; Iizuka, Norio ; Tsuda, Kazuhiko ; Obara, M.
Author_Institution :
Toshiba Res. & Dev. Center, Kawasaki
fDate :
12/1/1988 12:00:00 AM
Abstract :
The effect of using a p-type collector structure, in which a moderate electric field maintains the velocity overshoot through almost the entire depletion region, was examined by comparison with the n-type collector structure on actual devices. Increased electron velocity in a p-type collector region was verified. Specifically, the p-type collector structure exhibited a collector transit time less than half of that in the n-collector. This advantage of velocity overshoot in the p-collector was maintained up to the bias condition, where a large potential drop in collector depletion layer induced a high electric field in the p-layer
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; AlGaAs-GaAs; HBT; III-V semiconductors; collector transit time; electron velocity; moderate electric field; p-type collector; transit time reduction; velocity overshoot; Atomic layer deposition; Communication system control; Doping; Electrons; FETs; Gallium arsenide; HEMTs; Heterojunction bipolar transistors; MODFETs; Temperature;
Journal_Title :
Electron Devices, IEEE Transactions on