DocumentCode :
140940
Title :
Learning a cost function for microscope image segmentation
Author :
Nilufar, Sharmin ; Perkins, Theodore J.
Author_Institution :
Ottawa Hosp. Res. Inst., Ottawa, ON, Canada
fYear :
2014
fDate :
26-30 Aug. 2014
Firstpage :
5506
Lastpage :
5509
Abstract :
Quantitative analysis of microscopy images is increasingly important in clinical researchers´ efforts to unravel the cellular and molecular determinants of disease, and for pathological analysis of tissue samples. Yet, manual segmentation and measurement of cells or other features in images remains the norm in many fields. We report on a new system that aims for robust and accurate semi-automated analysis of microscope images. A user interactively outlines one or more examples of a target object in a training image. We then learn a cost function for detecting more objects of the same type, either in the same or different images. The cost function is incorporated into an active contour model, which can efficiently determine optimal boundaries by dynamic programming. We validate our approach and compare it to some standard alternatives on three different types of microscopic images: light microscopy of blood cells, light microscopy of muscle tissue sections, and electron microscopy cross-sections of axons and their myelin sheaths.
Keywords :
biological tissues; cellular biophysics; diseases; dynamic programming; image segmentation; medical image processing; active contour model; blood cells; cellular disease determinants; dynamic programming; electron microscopy cross sections; light microscopy; manual segmentation; microscope image segmentation; molecular disease determinants; muscle tissue sections; quantitative analysis; target object; tissue samples pathological analysis; training image; Blood; Cost function; Dynamic programming; Electron microscopy; Image segmentation; Muscles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2014.6944873
Filename :
6944873
Link To Document :
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