• DocumentCode
    140968
  • Title

    Estimation of brain internal structures by deforming brain atlas using finite element method

  • Author

    Kobayashi, Kaoru ; Morooka, Ken´ich ; Miyagi, Yasushi ; Fukuda, Toshio ; Tsuji, Takao ; Kurazume, Ryo ; Samura, Kazuhiro

  • Author_Institution
    Grad. Sch. of Inf. Sci. & Electr. Eng., Kyushu Univ., Fukuoka, Japan
  • fYear
    2014
  • fDate
    26-30 Aug. 2014
  • Firstpage
    5558
  • Lastpage
    5561
  • Abstract
    This paper presents a method for estimating the internal structures of a patient brain by deforming a standard brain atlas. Conventional deformation methods need several landmarks from the brain surface contour to fit the atlas to the patient brain shape. However, since the number and shapes of small sulci on the brain surface are different from each other, the determination of the accurate correspondence between small sulcus is difficult for experienced neurosurgeons. Moreover, the relationship between the surface shape and internal structure of the brain is unclear. Therefore, even if the deformed atlas is fitted to the patient brain shape exactly, the use of the deformed atlas does not always guarantee the reliable estimation of the internal structure of the patient brain. To solve these problems, we propose a new method for estimate the internal structure of a patient brain by the finite element method (FEM). In the deformation, our method select the landmarks from the contours of both the brain surface and the detectable internal structures from MR images.
  • Keywords
    biomedical MRI; brain; finite element analysis; physiological models; FEM; brain internal structure estimation; brain surface contour; finite element method; magnetic resonance images; patient brain shape; standard brain atlas deformation; sulcus; Accuracy; Brain; Estimation; Finite element analysis; Neurosurgery; Shape; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2014.6944886
  • Filename
    6944886