Title :
Computer generation of reference maps
Author_Institution :
McDonnell Aircraft Corp., St. Louis, Mo.
fDate :
3/1/1967 12:00:00 AM
Keywords :
Aerospace testing; Autocorrelation; Automatic test pattern generation; Bandwidth; Digital filters; Electronic equipment testing; Layout; Sensor systems; System testing; Test pattern generators;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
DOI :
10.1109/TAES.1967.5408765
