Title :
Early Modeling and Analysis of Packaged Systems
Author :
Schimmel, David E. ; Dislis, Chryssa
Author_Institution :
Georgia Institute of Technology
Keywords :
Automatic testing; Books; Costs; Design automation; Packaging; Process design; Space exploration; Space technology; System testing; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1998.706027
