Title :
VLSI, MCM, and WSI: a design comparison
Author :
Swartzlander, Earl E., Jr.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
Three IC technologies result in different outcomes-performance and cost-in two case studies. The author compares their designs in terms of silicon area, substrate size, and power consumption
Keywords :
VLSI; integrated circuit technology; multichip modules; wafer-scale integration; IC technologies; MCM; VLSI; WSI; cost; performance; power consumption; silicon area; substrate size; Bonding; Central Processing Unit; Centralized control; Energy consumption; Integrated circuit testing; Process control; Random access memory; Read-write memory; Silicon; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
