Title :
Testing NASA´s 3D-stack MCM space flight computer
Author :
Sasidhar, Koppol ; Alkalai, Leon ; Chatterjee, Abhijit
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Advanced packaging technologies pose major testing challenges for complex designs. The authors present test strategies used in the space flight computer designed for NASA´s Deep Space-1 mission
Keywords :
aircraft computers; circuit testing; computer testing; multichip modules; packaging; 3D-stack MCM; Deep Space-1; packaging; space flight computer; test strategies; Built-in self-test; Circuit testing; Clocks; Integrated circuit interconnections; Logic testing; NASA; Packaging; Registers; Space technology; System testing;
Journal_Title :
Design & Test of Computers, IEEE
