DocumentCode

1411192

Title

Microprocessor Testing Today

Author

Needham, W.

Author_Institution

Intel Corporation

Volume

15

Issue

3

fYear

1998

Firstpage

56

Lastpage

57

Keywords

Costs; Delay; Logic design; Logic devices; Logic testing; Microprocessors; Reflection; Sections; System testing; Transistors;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.1998.706033

Filename

706033