DocumentCode :
1411192
Title :
Microprocessor Testing Today
Author :
Needham, W.
Author_Institution :
Intel Corporation
Volume :
15
Issue :
3
fYear :
1998
Firstpage :
56
Lastpage :
57
Keywords :
Costs; Delay; Logic design; Logic devices; Logic testing; Microprocessors; Reflection; Sections; System testing; Transistors;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1998.706033
Filename :
706033
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1411192
