DocumentCode :
14112
Title :
Symbolic Moment Computation for Statistical Analysis of Large Interconnect Networks
Author :
Zhigang Hao ; Guoyong Shi ; Tan, Sheldon X.-D ; Tlelo-Cuautle, E.
Author_Institution :
Sch. of Microelectron., Shanghai Jiao Tong Univ., Shanghai, China
Volume :
21
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
944
Lastpage :
957
Abstract :
The shrinking technology feature size and dense large-scale integration make process variation a challenging issue directly confronting the latest design automation tools. Process variation causes severe variation in interconnect networks, including very large-scale integrated interconnect structures, such as clock trees, clock mesh, power-ground networks, and other wiring structures in 3-D integrated circuits. The traditional moment computation techniques are only partly useful for analyzing such variational problems, however, their computational efficiency cannot meet the quickly rising needs, such as statistical analysis. This paper presents a novel symbolic moment calculator (SMC) for variational interconnect analysis. The moment calculator is constructed in a regular data structure that incorporates binary decision diagrams for data storage and computation. Given an interconnect circuit, such a computation diagram has to be constructed only once and can be repeatedly invoked for computation of moments with varying parameter values. Also, the SMC is friendly to interconnect synthesis in that it can be incrementally modified according to the modifications made to the circuit structure. Applications of the SMC for fast moment computation, sensitivity analysis, and statistical timing analysis are addressed. Significant efficiency is demonstrated comparing to other existing methods.
Keywords :
binary decision diagrams; clocks; interconnections; statistical analysis; symbol manipulation; 3D integrated circuits; binary decision diagram; clock mesh; clock trees; computational efficiency; data storage; data structure; dense large scale integration; design automation tools; integrated interconnect structures; interconnect circuit structure; interconnect networks; power ground networks; process variation; sensitivity analysis; shrinking technology feature size; statistical timing analysis; symbolic moment calculator; symbolic moment computation; variational problems; wiring structures; Boolean functions; Capacitors; Couplings; Data structures; Inductors; Integrated circuit interconnections; RLC circuits; Binary decision diagram (BDD); clock mesh; incremental analysis; moment sensitivity; process variations; statistical analysis; symbolic moment;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2012.2197835
Filename :
6204105
Link To Document :
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