Title :
Test development for second-generation ColdFire microprocessors
Author :
Amason, Dale ; Crouch, Alfred L. ; Eisele, Renny ; Giles, Grady ; Mateja, Michael
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
This case study shows how test designers met fundamental microprocessor testing goals while adapting existing methodologies to a new architecture
Keywords :
computer testing; microprocessor chips; ColdFire microprocessors; microprocessor testing; second-generation; test development; Automatic test pattern generation; Automatic testing; Circuit testing; Delay; Flip-flops; Frequency; Microprocessors; Pins; Registers; Timing;
Journal_Title :
Design & Test of Computers, IEEE
