• DocumentCode
    1411211
  • Title

    Test development for second-generation ColdFire microprocessors

  • Author

    Amason, Dale ; Crouch, Alfred L. ; Eisele, Renny ; Giles, Grady ; Mateja, Michael

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • Volume
    15
  • Issue
    3
  • fYear
    1998
  • Firstpage
    70
  • Lastpage
    76
  • Abstract
    This case study shows how test designers met fundamental microprocessor testing goals while adapting existing methodologies to a new architecture
  • Keywords
    computer testing; microprocessor chips; ColdFire microprocessors; microprocessor testing; second-generation; test development; Automatic test pattern generation; Automatic testing; Circuit testing; Delay; Flip-flops; Frequency; Microprocessors; Pins; Registers; Timing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.706036
  • Filename
    706036
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1411211