Title :
Effective built-in self test for Booth multipliers
Author :
Gizopoulos, Dimitris ; Paschalis, Antonis ; Zorian, Yervant
Author_Institution :
Inst. of Inf. & Telecommun., NCSR Demokritos, Athens, Greece
Abstract :
Booth multipliers, widely used as embedded cores in general-purpose data path structures and specialized digital signal processors, pose serious testability problems. This generic BIST scheme does not require DFT modifications in the multiplier structure, guarantees fault coverage higher than 99%, and can be adopted by any module generator
Keywords :
built-in self test; multiplying circuits; Booth multipliers; built-in self test; data path structures; digital signal processors; embedded cores; module generator; multiplier structure; testability; Acceleration; Built-in self-test; Design for testability; Digital signal processors; Informatics; Signal generators; Telecommunication computing; Testing;
Journal_Title :
Design & Test of Computers, IEEE
