DocumentCode
1411320
Title
Effective Unconstrained Face Recognition by Combining Multiple Descriptors and Learned Background Statistics
Author
Wolf, Lior ; Hassner, Tal ; Taigman, Yaniv
Author_Institution
Blavatnik Sch. of Comput. Sci., Tel-Aviv Univ., Tel Aviv, Israel
Volume
33
Issue
10
fYear
2011
Firstpage
1978
Lastpage
1990
Abstract
Computer vision systems have demonstrated considerable improvement in recognizing and verifying faces in digital images. Still, recognizing faces appearing in unconstrained, natural conditions remains a challenging task. In this paper, we present a face-image, pair-matching approach primarily developed and tested on the “Labeled Faces in the Wild” (LFW) benchmark that reflects the challenges of face recognition from unconstrained images. The approach we propose makes the following contributions. 1) We present a family of novel face-image descriptors designed to capture statistics of local patch similarities. 2) We demonstrate how unlabeled background samples may be used to better evaluate image similarities. To this end, we describe a number of novel, effective similarity measures. 3) We show how labeled background samples, when available, may further improve classification performance, by employing a unique pair-matching pipeline. We present state-of-the-art results on the LFW pair-matching benchmarks. In addition, we show our system to be well suited for multilabel face classification (recognition) problem, on both the LFW images and on images from the laboratory controlled multi-PIE database.
Keywords
computer vision; face recognition; image classification; image matching; statistical analysis; vocabulary; classification; computer vision; digital images; face-image descriptors; image similarities; labeled faces in the wild; learned background statistics; multiPIE database; pair-matching approach; pair-matching pipeline; unconstrained face recognition; Benchmark testing; Face; Face recognition; Histograms; Image recognition; Pixel; Training; Face and gesture recognition; face recognition; image descriptors.; similarity measures;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2010.230
Filename
5674057
Link To Document