• DocumentCode
    1411575
  • Title

    Testing for convexity with Fourier descriptors

  • Author

    Kakarala, R.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Auckland Univ., New Zealand
  • Volume
    34
  • Issue
    14
  • fYear
    1998
  • fDate
    7/9/1998 12:00:00 AM
  • Firstpage
    1392
  • Lastpage
    1393
  • Abstract
    Fourier descriptors are widely used for determining the properties of planar contours. A test for determining whether a set of Fourier descriptors describes a convex contour is presented
  • Keywords
    Fourier series; pattern recognition; Fourier descriptors; convex contour; convexity testing;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19980943
  • Filename
    706089
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1411575