Title :
Testing for convexity with Fourier descriptors
Author_Institution :
Dept. of Electr. & Electron. Eng., Auckland Univ., New Zealand
fDate :
7/9/1998 12:00:00 AM
Abstract :
Fourier descriptors are widely used for determining the properties of planar contours. A test for determining whether a set of Fourier descriptors describes a convex contour is presented
Keywords :
Fourier series; pattern recognition; Fourier descriptors; convex contour; convexity testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980943
