Title :
Internal temperature distribution measurements in high power semiconductor lasers
Author :
O´Brien, P. ; O´Callaghan, J. ; McInerney, J.
Author_Institution :
Dept. of Phys., Nat. Univ. of Ireland, Cork, Ireland
fDate :
7/9/1998 12:00:00 AM
Abstract :
A novel technique to measure internal temperature distributions within high power semiconductor lasers with substrates transparent to the laser radiation is presented. The temperature resolution is better than 1°C with a spatial resolution of 1-2 μm. The results show highly non-uniform transverse temperature distributions and significant heating close to the facet at high output powers
Keywords :
laser variables measurement; semiconductor lasers; spectral methods of temperature measurement; temperature distribution; high output powers; high power semiconductor lasers; internal temperature distribution measurements; laser radiation transparent substrate; nonuniform transverse temperature distributions;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981004
