• DocumentCode
    1411652
  • Title

    Demonstration of 30 Gbit/s Generation of Superconductive True Random Number Generator

  • Author

    Sugiura, Tatsuro ; Yamanashi, Yuki ; Yoshikawa, Nobuyuki

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama, Japan
  • Volume
    21
  • Issue
    3
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    843
  • Lastpage
    846
  • Abstract
    True random number generators, which output truly random numbers by extracting entropy from physical phenomena such as thermal and electronic noises, are widely used in the field of the cryptographic communication systems. We have been developing a superconductive true random number generator that can generate truly random number sequences, impossible to be predicted, by utilizing the high-speed operation and high-sensitivity of superconductive integrated circuits. In this study, we have calculated the dependences of correlation of output random bits on the generation rate. Statistical tests have been performed on the basis of the NIST statistical test suite in order to evaluate the quality of the randomness of sequences generated by the superconductive true random number generator at high generation rate. We have generated a random number sequence consisting of 3.2 M-bit at the generation rate of 30 Gbit/s using the superconductive true random number generator, fabricated by the ISTEC-SRL 2.5 kA/cm2 Nb standard process. The generated random number sequences passed 13 kinds of the statistical tests in the NIST statistical test suit, although the 3 tests were not performed because of the shortage of the generated random numbers. The result sufficiently proves that a superconductive true random number generator can generate a high quality of random numbers that can be used for practical cryptographic applications, at a generation rate of up to 30 Gbit/s.
  • Keywords
    cryptography; entropy; high-speed integrated circuits; random number generation; statistical testing; superconducting logic circuits; NIST statistical test suite; bit rate 30 Gbit/s; cryptographic communication system; entropy extraction; high-speed integrated circuits; random number sequence generation; superconductive integrated circuits; superconductive true random number generator; Clocks; Cryptography; Generators; NIST; Noise; Superconductivity; Thermal noise; Comparators; Josephson junctions; random number generation; superconducting integrated circuits;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2010.2092401
  • Filename
    5674104