• DocumentCode
    1411832
  • Title

    Near-optimal Y-routed delay trees in nanometric interconnect design

  • Author

    Samanta, Tuhina ; Rahaman, Hafizur ; Dasgupta, Parthasarathi

  • Author_Institution
    Bengal Eng. & Sci. Univ., Howrah, India
  • Volume
    5
  • Issue
    1
  • fYear
    2011
  • fDate
    1/1/2011 12:00:00 AM
  • Firstpage
    36
  • Lastpage
    48
  • Abstract
    Performance-driven routing tree construction has immense research scope in today´s VLSI circuit design. In this study, the authors focuss on delay efficient routing tree construction. Our current work encompasses two aspects of research. On the one hand, the authors consider the construction of cost-effective global routing trees with the recently introduced Y-interconnects, and on the other hand, we utilise this framework for verifying the supremacy of the two-pole and Elmore delay estimate for its high fidelity. The authors also incorporated fidelity measure for two-pole delay estimate. In order to ensure accurate computation of fidelity, (i) the authors propose new statistically proven formulae for the fidelity metric, and (ii) compute the fidelity values based on delay estimates for optimal and near-optimal trees. Our experiments on several randomly generated problem instances and benchmarks confirm once again the supremacy of fidelity of two-pole and Elmore delay estimates over that of linear delay. The two-pole delay estimate is also observed to exhibit higher fidelity compared to Elmore delay in most of the cases.
  • Keywords
    VLSI; integrated circuit interconnections; nanoelectronics; Elmore delay estimate; VLSI circuit design; delay efficient routing tree construction; nanometric interconnect design; near-optimal Y-routed delay trees; two-pole delay estimate;
  • fLanguage
    English
  • Journal_Title
    Computers & Digital Techniques, IET
  • Publisher
    iet
  • ISSN
    1751-8601
  • Type

    jour

  • DOI
    10.1049/iet-cdt.2009.0074
  • Filename
    5674134