DocumentCode
1411832
Title
Near-optimal Y-routed delay trees in nanometric interconnect design
Author
Samanta, Tuhina ; Rahaman, Hafizur ; Dasgupta, Parthasarathi
Author_Institution
Bengal Eng. & Sci. Univ., Howrah, India
Volume
5
Issue
1
fYear
2011
fDate
1/1/2011 12:00:00 AM
Firstpage
36
Lastpage
48
Abstract
Performance-driven routing tree construction has immense research scope in today´s VLSI circuit design. In this study, the authors focuss on delay efficient routing tree construction. Our current work encompasses two aspects of research. On the one hand, the authors consider the construction of cost-effective global routing trees with the recently introduced Y-interconnects, and on the other hand, we utilise this framework for verifying the supremacy of the two-pole and Elmore delay estimate for its high fidelity. The authors also incorporated fidelity measure for two-pole delay estimate. In order to ensure accurate computation of fidelity, (i) the authors propose new statistically proven formulae for the fidelity metric, and (ii) compute the fidelity values based on delay estimates for optimal and near-optimal trees. Our experiments on several randomly generated problem instances and benchmarks confirm once again the supremacy of fidelity of two-pole and Elmore delay estimates over that of linear delay. The two-pole delay estimate is also observed to exhibit higher fidelity compared to Elmore delay in most of the cases.
Keywords
VLSI; integrated circuit interconnections; nanoelectronics; Elmore delay estimate; VLSI circuit design; delay efficient routing tree construction; nanometric interconnect design; near-optimal Y-routed delay trees; two-pole delay estimate;
fLanguage
English
Journal_Title
Computers & Digital Techniques, IET
Publisher
iet
ISSN
1751-8601
Type
jour
DOI
10.1049/iet-cdt.2009.0074
Filename
5674134
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