Title :
Reliability of Lead-Free Solder Joints Under a Wide Range of Thermal Cycling Conditions
Author :
Ma, Hongtao ; Ahmad, Mudasir ; Liu, Kuo-Chuan
Author_Institution :
Component Quality & Technol. Group, Cisco Syst., Inc., San Jose, CA, USA
Abstract :
In this paper, we report a comprehensive set of accelerated thermal cycling (ATC) tests that were performed on test vehicles with different package types, sizes, pitches, and solder joint alloy metallurgies using four different thermal cycling profiles: 0 to 100, -40 to 125, -55 to 125, and -60 to 150°C. Samples from the tests were analyzed for their failure modes, and failure rates were calculated by using Weibull statistics. The characterized life for each test condition was determined and analyzed. The impact of solder alloy metallurgies, package types, sizes, and pitches on acceleration factors of the ATC tests to fatigue life was also analyzed and discussed. The quantified discrepancies among several acceleration factors from different studies compared to the experimental data presented in this paper are illustrated. The results provide valuable guidance on the effects of package types, size, pitches, and solder joints alloy metallurgies on various ATC test conditions. In addition, failure analysis was performed at different stages of the tests for each thermal cycling condition. Dramatic failure mode shifts at extreme ATC conditions were observed. The significance and the long-term impact of the failure modes and failure mechanism shift between various ATC test conditions to the life prediction of lead-free solders are extensively discussed.
Keywords :
Weibull distribution; electronics packaging; failure analysis; life testing; reliability; soldering; Weibull statistics; accelerated thermal cycling tests; failure mechanism; failure mode; lead free solder joint reliability; solder joint alloy metallurgy; temperature -60 C to 150 C; thermal cycling condition; Acceleration; Fatigue; Lead; Reliability; Soldering; Stress; ATC; Acceleration factor; BGA; lead-free; pad cratering;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2011.2171054