DocumentCode :
1412167
Title :
Fabrication Insensitive Echelle Grating in Silicon-on-Insulator Platform
Author :
Feng, Dazeng ; Qian, Wei ; Liang, Hong ; Kung, Cheng-Chih ; Fong, Joan ; Luff, B. Jonathan ; Asghari, Mehdi
Author_Institution :
Kotura Inc., Monterey Park, CA, USA
Volume :
23
Issue :
5
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
284
Lastpage :
286
Abstract :
We demonstrate a compact, low crosstalk, low loss, and flat passband demultiplexer based on an echelle grating fabricated in the silicon-on-insulator (SOI) platform. The demonstrated 12 channel demultiplexer has an 8-nm channel spacing, 5.5-nm flat passband, 1.7-dB on-chip loss, and better than 25-dB optical crosstalk. By arranging the output waveguides very close to the zero degree angle of the echelle grating, the performance of the demonstrated device is made insensitive to the vertical angle of the grating facet. The fabricated devices have a very small footprint and have the potential to provide a low-cost demultiplexer solution for multichannel data transmission applications.
Keywords :
channel spacing; demultiplexing equipment; diffraction gratings; optical communication equipment; optical crosstalk; optical fabrication; silicon-on-insulator; SOI; Si; channel spacing; echelle grating; flat passband demultiplexer; loss 1.7 dB; optical crosstalk; silicon-on-insulator; Diffraction gratings; photonic integrated circuit; silicon-on-insulator (SOI); wavelength-division multiplexing (WDM);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2010.2102347
Filename :
5675664
Link To Document :
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