Title :
Recognition of Explosive Precursors Using Nanowire Sensor Array and Decision Tree Learning
Author :
Cho, Junghwan ; Li, Xiaopeng ; Gu, Zhiyong ; Kurup, Pradeep U.
Author_Institution :
Dept. of Civil & Environ. Eng., Univ. of Massachusetts Lowell, Lowell, MA, USA
fDate :
7/1/2012 12:00:00 AM
Abstract :
This paper aims to recognize explosive precursors using a nanowire sensor array and decision tree learning algorithm. The nanowire sensor array consisting of tin oxide sensors with four different additives, platinum (Pt), copper (Cu), indium (In), and nickel (Ni) was designed, fabricated and tested using the vapors from four explosive precursors, acetone, nitrobenzene, nitrotoluene, and octane, at eight different concentration levels. A novel pattern recognition technique based on decision tree learning was applied to classify the explosive precursors and estimate their concentration. Classification and regression tree (CART) algorithm was used for classification. The CART was also utilized for the purpose of structure identification in Sugeno fuzzy inference system for estimating the concentration of the precursors. Two CARTs were trained and their testing results were investigated. The decision tree based classifier and concentration estimator showed good recognition rates with an accuracy of 93.75% by CART and an average percent error rate of less than 4%, respectively.
Keywords :
copper; decision trees; indium; nanosensors; nanowires; nickel; organic compounds; pattern recognition; platinum; Cu; In; Ni; Pt; Sugeno fuzzy inference system; acetone; classification and regression tree algorithm; decision tree learning; explosive precursors; nanowire sensor array; nitrobenzene; nitrotoluene; octane; pattern recognition technique; Arrays; Decision trees; Estimation; Explosives; Feature extraction; Pattern recognition; Training; Classification; classification and regression tree (CART); concentration estimation; explosive precursors; fuzzy inference system; nanowire sensor array;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2011.2182042