DocumentCode :
1412326
Title :
Preferred crystal orientation of NiFe underlayers and its effect on magnetostriction of Co/Cu/Co thin films
Author :
Yeh, T. ; Sivertsen, J.M. ; Lin, C.L.
Author_Institution :
Solid State Electron. Center, Honeywell Inc., Plymouth, MN, USA
Volume :
34
Issue :
4
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
870
Lastpage :
872
Abstract :
The saturation magnetostriction of sputtered Co/Cu/Co thin films affected by preferred crystal orientation distribution of NiFe underlayers has been investigated. The experimental results indicated that preferred crystal orientation of NiFe underlayers plays a significant role in affecting the magnetoelastic behavior of coupled Co films separated by a thin Cu film. Negative value of saturation magnetostriction (-4.9×10-6) was obtained on sample film deposited on the NiFe underlayer with a more random crystal orientation distribution, while positive value of saturation magnetostriction (+11.6×10-6) was found on sample film deposited on highly [111] oriented NiFe film. It is clear that the preferred crystal orientation distribution of NiFe underlayers has a marked effect on the saturation magnetostriction of Co/Cu/Co films that λs is very sensitive to film structure and crystalline orientation texture
Keywords :
cobalt; copper; crystal orientation; iron alloys; magnetic multilayers; magnetic thin films; magnetoelastic effects; magnetostriction; nickel alloys; sputtered coatings; texture; Co-Cu-Co; Co/Cu/Co thin films; NiFe; NiFe underlayers; crystalline orientation texture; film structure; magnetoelastic behavior; preferred crystal orientation; saturation magnetostriction; sputtered films; Crystallization; Magnetic anisotropy; Magnetic films; Magnetic multilayers; Magnetic separation; Magnetostriction; Perpendicular magnetic anisotropy; Residual stresses; Saturation magnetization; Sputtering;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.706295
Filename :
706295
Link To Document :
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