DocumentCode :
1412537
Title :
Pushing Coated Conductor Critical Currents Beyond 1 kA per cm Width: Stacks of YBCO Layers
Author :
Jung, YeHyun ; Sheehan, Chris J. ; Coulter, J. Yates ; Matias, Vladimir ; Youm, Dojun
Author_Institution :
Dept. of Phys., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume :
21
Issue :
3
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
2953
Lastpage :
2956
Abstract :
For a number of superconducting power applications, a high value of the engineering critical current density (Je) for the wire is crucial. The superconducting layer in the coated conductor is typically a small portion of the overall cross-section, so increasing the superconductor fraction will directly result in an increase of Je . However, as the thickness of the superconductor is increased, Jc eventually drops. We describe a way to increase Je by making a stack of superconducting layers using sequential Ion-Beam Assisted Deposition (IBAD)/Superconductor deposition. Reactive Co-Evaporation by Cyclic Deposition and Reaction (RCE-CDR) is used for superconductor. An IBAD-textured layer resets the crystalline structure after each superconducting layer and we use IBAD-MgO for this purpose. However, IBAD-MgO texturing requires an extremely smooth starting surface (about 1 nm root mean square roughness), whereas the YBCO layer is typically 10-100 times rougher. We employ the Solution Deposition Planarization (SDP) process to planarize the rough surface of YBCO. The SDP layer is insulating and it provides for an easy way to separate the superconducting layers electrically. We discuss unique features of the stacking structure that allow for high Ic, low ac-losses in applied fields, as well as high Je .
Keywords :
barium compounds; critical current density (superconductivity); high-temperature superconductors; ion beam assisted deposition; liquid phase deposition; planarisation; rough surfaces; superconducting thin films; surface roughness; yttrium compounds; IBAD-textured layer; YBCO; YBCO layer; ac-losses; coated conductor critical currents; critical current density; crystalline structure; ion-beam assisted deposition-superconductor deposition; reactive coevaporation; root mean square roughness; rough surface; solution deposition planarization layer; stacking structure; surface roughness; Conductors; Heating; Substrates; Superconducting epitaxial layers; Surface treatment; Temperature measurement; Yttrium barium copper oxide; Multilayers; YBCO; solution deposition planarization; superconducting tapes;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2010.2093095
Filename :
5675714
Link To Document :
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